Pugna internum resistentia testis
Pugna Internum resistentia tester altum praecisione mensuræ instrumentum
Specifications:
HT-RT01 altilium Internum Resistentia Instrumentum
Product Information
| Notam nomen: | Heltecbms |
| Certification: | LENTITUDO |
| Origin: | Sina continenti |
| MOQ: | I PC |
| Pugna Type: | LFP, NMC, LTO, etc. |
Sarcina album
I.-I-RT01 I
II. LCR Kelvin IV-filum Fibulae * I
III. Test fixture * I
IV. USB data funem * I
V. Power Funiculus * I
VI. * I manual
Purchase Details
- Shipping a:
I. Company / Factory in Sina
II. In Civitatibus Foederatis Americae / Poland / Russia / Hispaniam / Brazil
Contact UsUt agere shipping Details - Payment: C% TT commendatur
- Returns & Refunds: Eligible ad Returns et Refunds
Features:
- Technology High resolutio XVIII-frenum ad conversionem chip ad curare accurate measurement;
- Duplex V digiti ostentationem, summa resolutio valorem de mensura est 0.1μΩ / 0.1mv, denique et altum praecisione;
- Lorem multi, unitas switching, tegere amplis mensurae necessitatibus;
- Automatic verticitatem iudicio et ostentationem non opus est distinguere altilium verticitatem;
- Libratum initus Kelvin quattuor filum mensuræ probe, altus anti-intercessiones structura;
- 1Khz ac current mensura modum, princeps accurate;
- Apta varii altilium / Pack mensura infra 100v;
- Equipped cum computatrum Vide iunctio terminatio, expansa mensurae et analysis munus.
Test parametri range
| POPULUM | Ac110V / AC220v | Praecisione | R: ± 0,5%; V: ± 0,5% |
| Copiam current | 100ma ~ 50ma | Test pace | V temporibus / s |
| MENSURIES PARAMETER | ① Acr② DCV | Range | SWITCH |
| Mensurae | R: 0 ~ 200Ωv: 0 ~ ± 100vdc | Mensuræ Rimitia | LCR Kelvin IV-filum Fibulae |
Overview
1. This instrument adopts the high-performance single-crystal microcomputer chip imported from ST Microelectronics, combined with the American "Microchip" high-resolution A/D conversion chip as the measurement control core, and the precise 1.000KHZ AC positive current synthesized by the phase-locked loop is used as measurement signal source apply on the tested element. Et generatae infirma voltage gutta signum est processionaliter per high- praecisione operational ampli, et correspondentes internum resistente valorem est resolvitur per intelligentes digital filter. Denique, quod est ostendi magna screen dot vulvam LCD.
II. Instrumentum habet commoda altum praecisione, automatic lima lectio, automatic verticitatem discrimen, ieiunium mensurae et lata mensuram range.
III. Instrumentum potest metimur voltage et internum resistentia de altilium (Pack) simul. Propter Kelvin type quattuor filum test probe, potest melius vitare superimposed intercessiones in mensurae contactu resistentia et filum resistentia, animadverto optimum anti-external measurement results.
IV. Instrumentum habet functionem serial cum PC, et potest animadverto in numerali analysis de multiple mensuras cum auxilio PC.
V. Instrumentum apta accurate mensurae ac internum resistentia variis altilium sarcinas (0 ~ 100v), praesertim ad humilis internum resistentia summus facultatem potentia gravida.
VI. Instrumentum apta altilium sarcina investigationis et progressionem, productio ipsum et altilium protegendo in qualitate ipsum.
SCULA
1. It can measure internal resistance and voltage of ternary lithium, lithium iron phosphate, lead acid, lithium ion, lithium polymer, alkaline, dry battery, nickel-metal hydride, nickel-cadmium, and button batteries, etc. Quickly screen and match all kinds of batteries and detect battery performance.
II. R & D et Qualis Testis pro Manufacturers de Lithium gravida, Nickel gravida, Polymer mollis-Pack Lithium gravida et altilium sarcinas. Emptum gravida qualitas et sustentationem testis ad stores.
Video
Request pro Quotation:
Jacqueline:jacqueline@heltec-bms.com/ LXXXVI CLXXXV (VIII) CCCLXXV (VI) DXXXVIII
Sucre:sucre@heltec-bms.com/ LXXXVI CXXXVI (VIII) DCCCXLIV MMCCCXIII
Nancy:nancy@heltec-bms.com/ LXXXVI CLXXXIV (VIII) CCXXIII (VII) DCCXIII
